Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits
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چکیده
A number of efforts have been recently devoted to fault modeling, fault simulation and test generation for asynchronous circuits (Shi and Makris 2004). Simulation based approach for testing gate delay faults in asynchronous sequential circuits was proposed by Sur-Kolay et al (2000). Shi and Makris (2006) have proposed a test method for path delay faults based on a design for test strategy. In simulation based approach no backtracking is required but their quality in terms of fault coverage is less. The quality of simulation based approach can be improved with the help of GA, which is suited for optimization and search problems.
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